| 标题 |
Investigations of surface reactions during C2F6 plasma etching of SiO2 with equipment and feature scale models |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 作者:Da Zhang; Mark J. Kushner 出版日期:2002-07-27 |
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(2025-6-4)