| 标题 |
High-Entropy Trace Intercalation in Layered Semiconductors: Synergistically Optimized Thermoelectric Performance via Entropy-Driven Transport Decoupling |
| 网址 | |
| DOI | |
| 其它 |
期刊:Acta Materialia 作者:Hongxiang Chen; Shiyu Li; Xiaochun Wen; J. Zhang; Bing Xiao; et al 出版日期:2026-02-01 |
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(2025-6-4)