| 标题 |
Etching sharp tips from thin metallic wires for tuning-fork-based scanning probe microscopy |
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| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 作者:Patrick Wallace Krantz; Venkat Chandrasekhar 出版日期:2020-02-07 |
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(2025-6-4)