| 标题 |
Broadband transverse unidirectional scattering and large range nanoscale displacement measuring based on the interaction between a tightly focused azimuthally polarized beam and a silicon hollow nanostructure |
| 网址 | |
| DOI |
10.1364/oe.486386
doi
|
| 其它 |
期刊:Optics Express 作者:Zhaokun Zhang; Yuqi Xiang; Wei Xu; Chucai Guo; Ken Liu; et al 出版日期:2023-04-24 |
| 求助人 | |
| 下载 |
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(2025-6-4)