| 标题 |
Thickness and Uniformity Modeling of the Deposition of Shape Memory Polymers for Information Storage Applications |
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| DOI | |
| 其它 |
期刊:2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference 作者:E. Wornyo; Ken Gall; G. S. May 出版日期:2008-05-05 |
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(2025-6-4)