| 标题 |
Quantitative evaluation of sidewall impact in micro-LEDs by ultrafast-gated hyperspectral imaging microscopy |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:Yi Lin; Yunfeng Jiang; Sentong Wang; Shouqiang Lai; Lihong Zhu; et al 出版日期:2026 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)