| 标题 |
Impact of the Unique Physical Properties of Copper in Silicon on Characterization of Copper Diffusion Barriers |
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| DOI | |
| 其它 |
期刊:Physica Status Solidi B-basic Solid State Physics 作者:A. A. Istratov; C. Flink; E. Weber 出版日期:2000-11-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)