| 标题 |
Performance Improvement via Stack Engineering and Post-bake Retention State Stabilization in Fully CMOS Compatible HfO2-based RRAM |
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| DOI | |
| 其它 |
期刊: 作者:Subhranu Samanta; Chen Zhixian; Hock Koon Lee; Weijie Wang; Song Wendong; et al 出版日期:2023-07-23 |
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(2025-6-4)