| 标题 |
Studies of the annihilation mechanism of threading dislocation in AlN films grown on vicinal sapphire (0001) substrates using transmission electron microscopy |
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| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:X. Q. Shen; H. Okumura; H. Matsuhata 出版日期:2005-09-02 |
| 求助人 | |
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(2025-6-4)