| 标题 |
[高分]
Effect of Heat Budget After Capacitor Formation on the Leakage Current Characteristics of ZrO2-Based High-k Dielectrics for Next-Generation Dynamic Random-Access Memory Capacitors |
| 网址 | |
| DOI |
10.1166/jnn.2020.17224
doi
|
| 其它 |
期刊:Journal of Nanoscience and Nanotechnology 作者:Jong-Min Lee; Pyungho Choi; Jong-Beom Seo; Byoungdeog Choi 出版日期:2019-08-06 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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(2025-6-4)