| 标题 |
Residual Stress Measurement of Silicon Nitride and Silicon Carbide by X-Ray Diffraction Using Gaussian Curve Method |
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| DOI | |
| 其它 |
期刊:Advances in X-ray Analysis 作者:Masanori Kurita; Ikuo Ihara; Nobuyuki Ono 出版日期:2019-03-28 |
| 求助人 | |
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(2025-6-4)