| 标题 |
Comprehensive Study of Distinct TID Mechanisms in Hardened SGT MOSFET under On /Off State and Annealing Recovery |
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| 其它 |
期刊:2026 IEEE 38th International Symposium on Power Semiconductor Devices and ICs (ISPSD) 作者:Junfeng Yu; Jihong Ding; Ruihan Gao; Haonan Liu; Jun Ye; et al 出版日期:2026-05-24 |
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(2025-6-4)