| 标题 |
Gradient-enhanced physics-informed long short-term memory networks for stable and accurate prediction of the RUL of electronic components |
| 网址 | |
| DOI | |
| 其它 |
期刊:Reliability Engineering & System Safety 作者:Chenyang Lai; P. Baraldi; E. Zio 出版日期:暂无 |
| 求助人 | |
| 下载 |
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(2025-6-4)