| 标题 |
Thermal Transient Effect and Improved Junction Temperature Measurement Method in High-Voltage Light-Emitting Diodes |
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| DOI | |
| 其它 |
期刊:IEEE Electron Device Letters 作者:H. Ye; Xian-Ping Chen; H. V. van Zeijl; A. W. J. Gielen; Guo-Qi Zhang 出版日期:2013-08-06 |
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(2025-6-4)