| 标题 |
Research on resolution improving the method of film thickness measurement through THz wave based on fitting the incomplete wave profile |
| 网址 | |
| DOI | |
| 其它 |
期刊:Optics Express 作者:Youjing Xia; Yunxia Ye; Zijie Dai; Zhiyi Jin; Liping Shi; Xudong Ren 出版日期:2025 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)