| 标题 |
Reduction of etching plasma damage on low dielectric constant fluorinated amorphous carbon films by multiple H2 plasma treatment |
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| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 作者:Jia-Min Shieh; Kou-Chiang Tsai; Bau-Tong Dai; Yew-Chung Wu; Yu-Hen Wu 出版日期:2002 |
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(2025-6-4)