| 标题 |
Growth and characterization of thick Ge epilayers on Si and Silicon-on-Insulator (SOI) substrates with low temperature Ge buffers |
| 网址 | |
| DOI | |
| 其它 |
期刊:Civil, Architecture and Environmental Engineering, Volume 1 作者:Zhiwen Zhou 出版日期:2017-04-26 |
| 求助人 | |
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(2025-6-4)