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Use of Full-Field X- ray Imaging and Ptychographic X-ray Computed Tomography for the Investigation of 3D Morphology of Micro-Nano Silver Materials for Advanced Electronics Packaging Applications |
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期刊:Microscopy and Microanalysis 作者:Yu-Chung Lin; Xiaoyang Liu; Kang-wei Chou; Esther H. R. Tsai; Chonghang Zhao; et al 出版日期:2021-07-30 |
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(2025-6-4)