| 标题 |
Study of the Relationship Between the Scalability of MTJs and Switching Field by Using Scanning Probe Microscope |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of the Korean Physical Society 作者:Jinhee Heo; Kyuhag Eum; Ilsub Chung 出版日期:2009 |
| 求助人 | |
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