| 标题 |
Quantitative XPS. Part I: Experimental determination of the relative analyser transmission function of two different spectrometers — a critical assessment of various methods, parameters involved and errors introduced |
| 网址 | |
| DOI | |
| 其它 |
期刊:Surface and Interface Analysis 作者:Lt. Weng; G. Vereecke; M. Genet; P. Bertrand; W. Stone 出版日期:1993-03-01 |
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(2025-6-4)