| 标题 |
High-Mobility and Reliability Ultra-Thin-Channel Oxide Semiconductor Field-Effect Transistors for Chip-Interconnect-Embedded Logic and Ferroelectric Memory |
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| DOI | |
| 其它 |
期刊:Adv Mater 作者:Chen CK, Hooda S, Sivan M, Wan Q, Villena MA, Beltrando B, Xu Z, Fang Z, Zamburg E, Roldán JB, Larcher L, Thareja G, Thean AV 出版日期:2026-07-31 |
| 求助人 | |
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(2025-6-4)