| 标题 |
High-resolution characterization of nitrogen doping concentration uniformity in n-type 4H-SiC wafers based on near-ultraviolet photoluminescence |
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| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Dapeng Chang; Mengyan Li; Xiufang Chen; Xianglong Yang; Muqing Zhang; et al 出版日期:2026-07-01 |
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(2025-6-4)