| 标题 |
Developing the stress–strain curve to failure using mesoscale models parameterized from molecular models |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Nancy Iwamoto 出版日期:2012-05-01 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |