| 标题 |
[高分]
Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring |
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| DOI | |
| 其它 |
期刊:Journal of Statistical Computation and Simulation 作者:Xuefeng Feng; Jiayin Tang; N. Balakrishnan; Qitao Tan 出版日期:2024-09-26 |
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(2025-6-4)