| 标题 |
[高分]
ELG_YOLOv11: Enhancing YOLO for Industrial Surface Defect Detection via Edge and Local-Global Perception Modules |
| 网址 | |
| DOI |
10.1109/aiahpc66801.2025.11290203
doi
|
| 其它 |
期刊:2025 5th International Conference on Artificial Intelligence, Automation and High Performance Computing (AIAHPC) 作者:Zhikun Wang; Mengfei Wu; Yanlei Bian; Wenxue Sun 出版日期:2025-09-19 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
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(2025-6-4)