| 标题 |
Structure refinement and anisotropic atomic displacement parameters of 1M Illite: Rietveld and pair distribution function analysis using synchrotron X-ray radiation |
| 网址 | |
| DOI |
10.1107/s1600576725004170
doi
|
| 其它 |
期刊:Journal of Applied Crystallography 作者:Seungyeol Lee 出版日期:2025-06-20 |
| 求助人 | |
| 下载 |
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(2025-6-4)