| 标题 |
Rapid High-Precision Full-Contour Metrology of Large-Format Transparent Specimens via Synergized Dynamic Imaging and Computational Reconstruction |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Instrumentation and Measurement 作者:Wei Ding; Yanhua Cheng; Yu Shi; Qing-Guo Wang 出版日期:2025 |
| 求助人 | |
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(2025-6-4)