| 标题 |
Focused Ion Beam (FIB) combined with SEM and TEM: Advanced analytical tools for studies of chemical composition, microstructure and crystal structure in geomaterials on a nanometre scale |
| 网址 | |
| DOI | |
| 其它 |
期刊:Chemical Geology 作者:Richard Wirth 出版日期:2008-06-12 |
| 求助人 | |
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(2025-6-4)