| 标题 |
Highly selective and vertical etch of silicon dioxide using ruthenium films as an etch mask |
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| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 作者:William J. Mitchell; Brian J. Thibeault; Demis D. John; Thomas E. Reynolds 出版日期:2021-05-27 |
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(2025-6-4)