| 标题 |
An overview of HR-EBSD techniques for mapping local stress and dislocations in crystalline materials at sub-micron resolution |
| 网址 | |
| DOI | |
| 其它 |
期刊:Progress in Materials Science 作者:Timothy Ruggles; William Gilliland; David T. Fullwood; Josh Kacher 出版日期:2025-09-30 |
| 求助人 | |
| 下载 |
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(2025-6-4)