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Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry
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期刊: 作者:Thomas E. Tiwald and John A. Woollam Stefan Zollner, Jim Christiansen, R. B. Gregory, T. Wetteroth, and S. R. Wilson Adrian R. Powell 出版日期:Phys. Rev. B 60, 11464 – Published 15 October, 1999 |
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(2025-6-4)