| 标题 |
Fixed interface charges between AlGaN barrier and gate stack composed of in situ grown SiN and Al2O3 in AlGaN/GaN high electron mobility transistors with normally off capability |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:M. Capriotti; A. Alexewicz; C. Fleury; M. Gavagnin; O. Bethge; et al 出版日期:2014-03-18 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)