| 标题 |
Simulation and Validation of Mass Transfer Capability and Electric Field Distribution for Wafer-Level TGV Copper Electroplating Process Development |
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| DOI | |
| 其它 |
期刊:2025 IEEE 27th Electronics Packaging Technology Conference (EPTC) 作者:Yihan Xie; Qiqiang Wang; Yan Wang; Yingying Liu; Xinyuan Shen; et al 出版日期:2025-12-02 |
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(2025-6-4)