| 标题 |
Towards information storage by designing both electron and hole detrapping processes in bismuth and lanthanide-doped LiRE(Si,Ge)O4 (RE = Y, Lu) with high charge carrier storage capacity |
| 网址 | |
| DOI | |
| 其它 |
期刊:Chemical Engineering Journal 作者:Tianshuai Lyu; P. Dorenbos 出版日期:2020-03-15 |
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(2025-6-4)