| 标题 |
Etching of porous SiOCH materials in fluorocarbon-based plasmas |
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| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 作者:N. Posseme; T. Chevolleau; O. Joubert; L. Vallier; N. Rochat 出版日期:2004-11-01 |
| 求助人 | |
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(2025-6-4)