| 标题 |
Development of AOI(Automatic Optical Inspection) System for Defect Inspection of Patterned TFT-LCD Panels Using Adjacent Pattern Comparison and Border Expansion Algorithms |
| 网址 | |
| DOI |
10.5302/j.icros.2008.14.5.444
doi
|
| 其它 |
期刊:Journal of Institute of Control, Robotics and Systems 作者: 出版日期:2010-10-07 |
| 求助人 | |
| 下载 |
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(2025-6-4)