| 标题 |
Investigation of the Capacitance–Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment |
| 网址 | |
| DOI | |
| 其它 |
期刊:ACS Applied Materials & Interfaces 作者:Hong-Chih Chen; Chuan-Wei Kuo; Ting-Chang Chang; Wei-Chih Lai; Po-Hsun Chen; et al 出版日期:2019-10-01 |
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(2025-6-4)