| 标题 |
Degradation modeling with spatial mapping method in low temperature poly silicon thin film transistor aged off-state bias |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Kihwan Kim; Min-Kyu Song; Soonkon Kim; Hyojung Kim; Sangho Jeon; et al 出版日期:2021-01-01 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)