| 标题 |
 Effects of Deposition Power and Annealing Temperature on Indium Zinc Oxide (IZO) Film’s Properties and Their Applications to the Source–Drain Electrodes of Amorphous Indium Gallium Zinc Oxide (a-IGZO) Thin-Film Transistors (TFTs) |
| 网址 | |
| DOI | |
| 其它 |
期刊：Nanomaterials 作者：Yih-Shing Lee; Chih-Hsiang Chang; Bing-Shin Le; Vo-Truong Thao Nguyen; Tsung-Cheng Tien; Horng-Chih Lin 出版日期：2025-05-22 |
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(2025-6-4)
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