| 标题 |
Ion migration and interface engineering in emerging halide perovskite technologies for enhanced stability, mobility, and device optimization in FETs and memory devices |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Science: Advanced Materials and Devices 作者:Hyojung Kim 出版日期:2025 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
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(2025-6-4)