| 标题 |
Kinetic Monte Carlo simulation reveals defect charge accumulation favoring ferroelectric phase formation in Hf1−xZrxO2 thin films |
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| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:Luis Azevedo Antunes; Sebastian Obernberger; Paul Schwermer; Joshua Hintz; Richard Ganser; et al 出版日期:2025-06-09 |
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(2025-6-4)