| 标题 |
Simulation study on electrical properties of p-GaN gate normally-off HEMT devices affected by Al mole fraction in AlGaN barrier layer |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Physics: Conference Series 作者:Songming Xiong; Wenxian Huang; Ali Hassan; Rong Zhong 出版日期:2022-10-31 |
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(2025-6-4)