| 标题 |
XPS characterisation of in situ treated lanthanum oxide and hydroxide using tailored charge referencing and peak fitting procedures |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Electron Spectroscopy and Related Phenomena 作者:Martin F. Sunding; Kianoosh Hadidi; Spyros Diplas; Ole Martin Løvvik; Truls Norby; et al 出版日期:2011-04-25 |
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(2025-6-4)