| 标题 |
Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic defect densities |
| 网址 | |
| DOI | |
| 其它 |
期刊:Physical Chemistry Chemical Physics 作者:William C. Chueh; Sossina M. Haile 出版日期:2009-01-01 |
| 求助人 | |
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(2025-6-4)