| 标题 |
A Comparative Study of Total Ionizing Dose and Heavy-Ion Irradiation Effects on n-Channel and p-Channel SGT MOSFETs |
| 网址 | |
| DOI | |
| 其它 |
期刊:2025 6th International Conference on Radiation Effects of Electronic Devices (ICREED) 作者:Yuan Wang; Xiaozong Huang; Rui Yang; Jie Jiang; Fan Xiang; et al 出版日期:2025-04-16 |
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(2025-6-4)