| 标题 |
Research progress on semiconductor junction temperature thermal testing and thermal digital twin technology |
| 网址 | |
| DOI | |
| 其它 |
期刊:Measurement 作者:Yin Wei; Haichao Feng; Yuefeng Li; Dezhi Jin; Aijun Zhou; et al 出版日期:2025-07-24 |
| 求助人 | |
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(2025-6-4)