| 标题 |
Enhanced industrial anomaly detection via CutMask data augmentation: a self-supervised approach |
| 网址 | |
| DOI | |
| 其它 |
期刊:The Visual Computer 作者:Le Yang; Dingjian Yao; Wenhan Yang; Zhengsong Wang 出版日期:2026-06-23 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)