| 标题 |
Dual-level knowledge transfer for few-sample process monitoring aided by orthogonal heterogeneous component analysis |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of the Franklin Institute 作者:Kai Wang; Wangkun Qu; Qinqiang Sun; Jie Han; Xiaofeng Yuan; Yalin Wang 出版日期:2026-04-17 |
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(2025-6-4)