| 标题 |
Investigation on the accuracy of the junction temperature determined by the VCE(T) method under different load pulse durations in power cycling test |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Jie Chen; Erping Deng; Peng Liu; Yongzhang Huang 出版日期:2021 |
| 求助人 | |
| 下载 |
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(2025-6-4)