| 标题 |
The Quality Investigation of 6H-SiC Crystals Grown by a Conventional PVT Method with Various SiC Powders |
| 网址 | |
| DOI |
10.4313/teem.2010.11.2.061
doi
|
| 其它 |
期刊:Transactions on Electrical and Electronic Materials 作者:Im-Gyu Yeo; Tae-Woo Lee; Won-Jae Lee; Byoung-Chul Shin; Jung-Woo Choi; et al 出版日期:2010-06-03 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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(2025-6-4)